Challenges of Decoding Data in Spectroscopy, Reflectometry, X-Ray and Electron Diffraction
This is the first book to present the direct method for solving the inverse problems in the X-ray multicomponent spectroscopy and small-angle X-ray scattering, X-ray diffraction tomography, grazing-incidence small-angle X-ray reflectometry of multilayer structures, and electron multibeam diffraction imaging. It considers the theory of numerical analysis of multivariate additive spectra of non-separable mixtures, and decodes data obtained using the X-ray diffraction tomography technique. The book also discusses the theory of high-resolution X-ray reflectometry (HRXR) of multilayer structures (MLS) based on the modified Parratt relationships for reflection and transmission coefficients and the phase problem in electron structural crystallography.
Dr Felix N. Chukhovskii is Full Professor of Physics and Materials Science at Shubnikov’s Institute of Crystallography in the Federal Scientific Research Centre of Crystallography and Photonics at the Russian Academy of Sciences. His work explores the dynamical theory of the X-ray and electron scattering in crystals with defects. He is the author of 183 publications.
Dr Vladimir V. Volkov is a Leader Scientist at Shubnikov’s Institute of Crystallography in the Federal Scientific Research Centre of Crystallography and Photonics at the Russian Academy of Sciences. His research interests are the small-angle scattering data treatment and interpretation, determination of the structure of biopolymers in solutions, and nanosized complex systems, and he is the author of 142 journal articles.
Dr Petr V. Konarev is a Senior Scientist at Shubnikov’s Institute of Crystallography in the Federal Scientific Research Centre of Crystallography and Photonics at the Russian Academy of Sciences. His research focus is the development of small-angle X-ray scattering (SAXS) methods for the analysis of biological macromolecules, and he is the author of 162 journal articles.
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