Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.
The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.
Igor F. Mikhailov is a Doctor of Physical and Mathematical Sciences and Chief Researcher at the Kharkov Polytechnic Institute, Ukraine, where he has been the Head of the X-ray Laboratory of the Department of Physics of Metals and Semiconductors for 30 years. He is the author of more than 200 scientific publications.
Alexey A. Baturin is a PhD Candidate in Physical and Mathematical Sciences and a Senior Scientific Researcher in the Department of Physics of Metals and Semiconductors at the Kharkov Polytechnic Institute, Ukraine. He has 20 years of experience in the field of X-ray instrument making, and is one of the main developers of the family of portable instruments SPRUT.
Anton I. Mikhailov is a PhD Candidate in Physical and Mathematical Sciences and a Senior Scientific Researcher at Kharkov National University, Ukraine. He is a developer of new X-ray optic schemes for increasing the contrast of fluorescence and Compton scattering spectra, and his interests include two-layer and complex re-radiators and optimization of the scheme for fluorescence selective excitation by the criterion of a detection limit.
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